Jump to Content

Security Challenges During VLSI Test

Kurt Rosenfeld
Proceedings of 2011 IEEE NEWCAS Conference, IEEE


VLSI testing is a practical requirement, but unless proper care is taken, features that enhance testability can reduce system security. Data confidentiality and intellectual property protection can be breached through testing security breaches. In this paper we review testing security problems, focusing on the scan technique. We then present some countermeasures which have recently been published and we discuss their characteristics.