Modeling Capacitor Derating in Power Integrity Simulation

Tianjian Lu
Ken Wu
Zhiping Yang
EMC+SIPI 2017 in Washington DC (2017)

Abstract

In this work, we propose a simulation methodology
that incorporates derating models of decoupling capacitors
for power integrity analysis. The construction of the derating
models of decoupling capacitors is based on the impedance
measurement and curve fitting method. Three approaches of
impedance measurement are compared and the most accurate
one is selected to build the derating models. The curve fitting
method converts the measured impedance into circuit models. A
library file containing the derating models is generated such that
it can be repeatedly used for different products at various design
cycles. The derating library takes into account the operation
conditions such as temperature and DC bias as well as the vendor
information. The proposed simulation methodology with the
derating library achieves high accuracy, which is demonstrated
through correlations with measurements.

Research Areas