CutPaste: Self-Supervised Learning for Anomaly Detection and Localization

In this work, we aim at constructing a high performance model for defect detection that detects unknown anomalous patterns of an image without anomalous data. To this end, we propose a simple two-stage framework for building anomaly detectors using normal training data only, where we first learn self-supervised deep representations and then build a generative one-class classifier on learned representations. We learn representations by classifying normal data from the CutPaste, a simple data augmentation strategy that cuts an image patch and pastes at random location of a large image. Our empirical study on MVTec anomaly detection database demonstrates the proposed algorithm is general to detecting various types of real-world defects. We bring the improvement upon previous arts by 3 AUCs when learning representations from scratch. By transfer learning representations from an ImageNet pretrained model, we achieve a new state-of-the-art 96.6 AUC. Lastly, we extend the framework to learn and extract representations from patches to allow localization of defective areas without the need of annotation.

• Machine Perception

• Machine Intelligence