Accelerating Post-Silicon Validation : ATE Bring-up and Test Leveraging Tessent Streaming Scan Network (SSN) for High Bandwidth IJTAG
Abstract
As SoC complexity grows, traditional serial JTAG/IJTAG interfaces increasingly become a bottleneck for post-silicon validation and instrument orchestration. This paper details the first-pass ATE bring-up and test experience using Tessent High-Bandwidth IJTAG (HB-IJTAG), a solution that maps IEEE 1687 control sequences directly onto the Streaming Scan Network (SSN) bus fabric
