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Evaluating Static Analysis Defect Warnings on Production Software

Nathaniel Ayewah
William Pugh
J. David Morgenthaler
John Penix
YuQian Zhou
Proceedings of the 7th ACM SIGPLAN-SIGSOFT workshop on Program analysis for software tools and engineering, ACM Press, New York, NY, USA (2007), pp. 1-8
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Abstract

Classification of static analysis warnings into false positive, trivial or serious bugs: Experience on Java JDK and Google codebase

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