IC-based Antenna Switch Modeling and Robustness Evaluation for SEED Applications
Abstract
ESD discharges to antennas can damage the RF
front end. In particular, antennas with highly inductive ground
connections allow large ESD-induced voltages at their RF
terminals. This work investigates the ESD properties of an RF
switch used as an antenna tuner by measuring the voltages and
currents at its terminals and building a SPICE model. The goal is
to predict the damage threshold when the switch is used in an RF
front end.