Google Research

Training in Turmoil: Silent Data Corruption in Systems at Scale

  • Rich Bonderson
International Test Conference (2021)

Abstract

As Silicon process technology marches on and system scale continues increasing, are our traditional methods of ATE and functional testing enough to keep up? What can we do in the face of quality challenges and silent data corruption? Are there efficient solutions for closing test gaps and increasing defect detection and mitigation? We set out with these questions and call for action in resolving an increasing problem.

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